A Numerical Analysis and Experimental Demonstration of a Low Degradation Conductive Bridge Resistive Memory Device

Bibliography:

D. Berco, U. Chand, H. Fariborzi, “A Numerical Analysis and Experimental Demonstration of a Low Degradation Conductive Bridge Resistive Memory Device,” Journal of Applied Physics, 122 (16), 152-164, Oct 2017​.

Authors:

D. Berco, U. Chand, H. Fariborzi.

Keywords:

ReRAM

Year:

2017