Hardware security and trust for wireless integrated circuits

Overview

Abstract

We will discuss Integrated Circuit (IC) security and trust threats and corresponding countermeasures with a focus on wireless ICs. We will present solutions to protect RF transceiver ICs against piracy attempted by malicious System-on-Chip (SoC) integrators, foundries, or end-users via reverse-engineering. We will also present hardware Trojan attacks on RF transceivers aiming at creating a covert channel for stealing sensitive information, i.e., cypher keys.

Brief Biography

Haralampos-G. Stratigopoulos received the Diploma in electrical and computer engineering from the National Technical University of Athens, Athens, Greece, in 2001 and the Ph.D. in electrical engineering from Yale University, New Haven, USA, in 2006. He is a Research Director of the French National Center for Scientific Research (CNRS) at the LIP6 laboratory of Sorbonne Université, Paris, France. Before he was Researcher with the CNRS at the TIMA Laboratory, Université Grenoble Alpes, Grenoble, France. His main research interests are in the areas of hardware security, neuromorphic computing, and  design-for-test for analog, mixed-signal, RF circuits and systems. He was the General Chair of the 2015 IEEE International Mixed-Signal Testing Workshop (IMSTW), the Program Chair of the 2017 IEEE European Test Symposium (ETS), and the General Chair of the 2021 and 2022 AI Hardware: Test, Reliability and Security (AI-TREATS) Workshop. He has served on the Technical Program Committees of Design, Automation, and Test in Europe Conference (DATE), Design Automation Conference (DAC), IEEE International Conference on Computer-Aided Design (ICCAD), IEEE European Test Symposium (ETS), IEEE International Test Conference (ITC), IEEE VLSI Test Symposium (VTS), and several others international conferences. He has served as an Associate Editor of IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on Circuits and Systems I: Regular Papers, IEEE Design & Test, and Springer Journal of Electronic Testing: Theory & Applications.